T1/E1 Basic Bit Error Rate Test Overview The Bit Error Rate Test (BERT) application generates/detects unframed, framed, and fractional data that are defined in Pseudo Random Bit Sequence (PRBS). In addition to these, drop and insert capability is provided. A variety of standard data patterns are available for test purposes including static and user selected patterns. To open BER application, navigate to T1/E1 Analyzer > Intrusive Test > Bit Error Rate Test. Select the card on which BER test has to be performed. The screenshot given above displays the BER test application running on Card1: The functionality of the PRBS data stream is illustrated in the figure below: Framing Patterns selection for T1/E1 The framing patterns available in BER test are Unframed, Full-Framed, Fractional without Drop and Insert (D&I) and Fractional with Drop and Insert modes. These can be selected from the drop-down menu in the "Full-Fractional-Unframe" section. Unframed T1/E1: Entire T1/...